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Discover 47 products
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Image | Part Number | Manufacturer | Quantity | Delivery period | Unit Price | Buy | Description | Packaging | Series | Operating Temperature | Number of Bits | Supply Voltage | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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Image | Part Number | Manufacturer | Quantity | Delivery period | Unit Price | Buy | Description | Packaging | Series | Operating Temperature | Number of Bits | Supply Voltage | Logic Type | |
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Texas Instruments |
3,627
|
3 days |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 24-SOIC
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Tube | 74ABT | -40°C ~ 85°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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Texas Instruments |
736
|
3 days |
-
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MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
Tube | 74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||
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Texas Instruments |
Inquiry
|
- |
-
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MOQ: 2000 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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Texas Instruments |
260
|
3 days |
-
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MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
Cut Tape (CT) | 74ABT | -40°C ~ 85°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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|
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Texas Instruments |
260
|
3 days |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
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- | 74ABT | -40°C ~ 85°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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Texas Instruments |
Inquiry
|
- |
-
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MOQ: 2000 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-SOIC
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Tape & Reel (TR) | 74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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Texas Instruments |
Inquiry
|
- |
-
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MOQ: 2000 MPQ: 1
|
IC EMBEDDED TEST BUS CTRL 24SOIC
|
Tape & Reel (TR) | 74LVT | -40°C ~ 85°C | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
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|
|
Texas Instruments |
1,711
|
3 days |
-
|
MOQ: 1 MPQ: 1
|
IC EMBEDDED TEST BUS CTRL 24SOIC
|
Cut Tape (CT) | 74LVT | -40°C ~ 85°C | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
1,711
|
3 days |
-
|
MOQ: 1 MPQ: 1
|
IC EMBEDDED TEST BUS CTRL 24SOIC
|
- | 74LVT | -40°C ~ 85°C | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
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|
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Texas Instruments |
Inquiry
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC 10BIT VOLTAGE CLAMP 24-SOIC
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Tape & Reel (TR) | - | -40°C ~ 85°C | 10 | - | Voltage Clamp | ||
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|
|
Texas Instruments |
672
|
3 days |
-
|
MOQ: 1 MPQ: 1
|
IC 10BIT VOLTAGE CLAMP 24-SOIC
|
Cut Tape (CT) | - | -40°C ~ 85°C | 10 | - | Voltage Clamp | ||
|
|
|
Texas Instruments |
672
|
3 days |
-
|
MOQ: 1 MPQ: 1
|
IC 10BIT VOLTAGE CLAMP 24-SOIC
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- | - | -40°C ~ 85°C | 10 | - | Voltage Clamp | ||
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Texas Instruments |
10
|
3 days |
-
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MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE W/FF 24-SOIC
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Tube | 74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
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Texas Instruments |
Inquiry
|
- |
-
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MOQ: 325 MPQ: 1
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IC 10BIT VOLTAGE CLAMP 24-SOIC
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Tube | - | -40°C ~ 85°C | 10 | - | Voltage Clamp | ||
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Texas Instruments |
Inquiry
|
- |
-
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MOQ: 125 MPQ: 1
|
IC TRANSCEIVER 1-9BIT 24SOIC
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Tube | 74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | 8-Bit to 9-Bit Parity Bus Transceiver | ||
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Texas Instruments |
Inquiry
|
- |
-
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MOQ: 100 MPQ: 1
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IC SCAN TEST DEVICE 24SOIC
|
Tube | 74ABT | -40°C ~ 85°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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|
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Texas Instruments |
Inquiry
|
- |
-
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MOQ: 2000 MPQ: 1
|
IC 10-BIT SCAN PORT XCVR 24-SOIC
|
Tape & Reel (TR) | 74LVT | -40°C ~ 85°C | 10 | 2.7 V ~ 3.6 V | Addressable Scan Ports | ||
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Texas Instruments |
Inquiry
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC TEST-BUS CONTROLLER 24-SOIC
|
Tape & Reel (TR) | 74LVT | -40°C ~ 85°C | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
Inquiry
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC TEST-BUS CONTROLLER 24-SOIC
|
Tape & Reel (TR) | 74LVT | -40°C ~ 85°C | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
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Texas Instruments |
Inquiry
|
- |
-
|
MOQ: 75 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
Tube | 74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Inverting Buffers |
